ATS 2008 - Call for Papers

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Committees -- More Information

Scope

The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind. The official language of the symposium is English.

Topics of interest include, but are not limited to:

Automatic Test Generation / Fault Simulation
Design for Testability / Synthesis for Testability
Built-In Self-Test / Test Data Compression
Delay Testing
Defect-Based Testing / IDDX Testing
Power Issues in Test
Fault Modeling & Diagnosis
Memory Test / FPGA Test
Analog and Mixed-Signal Test
RF Testing / High-Speed I/O Test
System-on-a-Chip Test
Board and System Test
Network Protocol Testing
Design Verification and Validation
On-Line Test
Fault Tolerance / Dependable System
Software Testing / Software Design for Testing
Economics of Test

Submissions

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REGULAR SESSION : The ATS'08 Program Committee invites original, unpublished paper submissions for ATS'08. Paper submissions should be complete manuscripts, not exceeding six pages (including figures, tables, and bibliography) in a standard IEEE two-column format. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status. On the title page, please include: author name(s) and affiliation(s), and the mailing address, phone number, fax number, and e-mail address of the contact author.

An abstract of 50 words or less and 5-10 keywords are also required. All submissions are to be made electronically through the ATS'08 website. Detailed instructions for submissions are to be found at the ATS'08 website. Electronic submissions in PDF files are strongly recommended.

The submission will be considered evidence that upon acceptance the author(s) will prepare the final manuscript (six pages for regular session) in time for inclusion in the proceedings and will present the paper at the Symposium.

INDUSTRY SESSION : This session will address a wide range of practical problems in LSI test, board and system test, diagnosis, failure analysis, design verification, and so on. A one-page abstract is required for submission. Each submission should also include the complete address and designate a contact person and a presenter. Abstract submissions should be emailed to Industry Chair
(ats08-ic@dsgn.im.hiroshima-cu.ac.jp).

Key Dates

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REGULAR SESSION

Submission deadline: May 19, 2008
Notification of acceptance: July 11, 2008
Camera ready copy: August 11, 2008

INDUSTRY SESSION

Submission deadline: June 23, 2008
Notification of acceptance: July 11, 2008
Camera ready copy: August 11, 2008

Committees

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General Co-Chairs
Yasuo Sato, Hitachi, Ltd.
Seiji Kajihara, Kyushu Institute of Technology

Program Chair
Kazumi Hatayama, STARC

Program Vice-Chair
Hiroshi Takahashi, Ehime University

Finance Chair
Yukiya Miura, Tokyo Metropolitan University

Local Arrangement Chair
Masaki Hashizume, Tokushima University

Local Arrangement Vice-Chair
Hiroyuki Yotsuyanagi, Tokushima University

Registration Chair
Toshinori Hosokawa, Nihon University

Publicity Chair
Hideyuki Ichihara, Hiroshima City University

Publications Chair
Yoshinobu Higami, Ehime University

Industry Chair
Toshinobu Ono, NEC Electronics Corporation

Tutorial Chair
Michiko Inoue, Nara Institute of Science and Technology

Audio Visual Chair
Masayuki Arai, Tokyo Metropolitan University

Secretary
Satoshi Ohtake, Nara Institute of Science and Technology

North American Liaison
Krishnendu Chakrabarty, Duke University

European Liaison
Patrick Girard, LIRMM

Ex Officio
Hideo Fujiwara, Nara Institute of Science and Technology

Program Committee Members:
E. Cota
D. K. Das
S. Demidenko
J. Dworak
M. Emori
D. Gizopoulos
S.-Y. Huang
T. Inoue
H. Ito
B. Kaminska
S. Kang
K. S. Kim
E. Larsson
K.-J. Lee
H. Li
E. J. Marinissen
S. Mitra
N. Mukherjee
F. Muradali
K. Nakamae
H. Nakamura
N. Nicolici
H. Okawara
Y. Okuda
S. Park
I. Pomeranz
P. Prinetto
R. Raina
S. Ravi
M. Renovell
A. Rubio
M. Sanada
S. Sasho
T. Shinogi
P. Song
M. Takakura
N. A. Touba
J. Tyszer
M. Ushikubo
A. Uzzaman
A. Wada
L.-C. Wang
S.-J. Wang
X. Wen
C.-W. Wu
H.-J. Wunderlich
D. Xiang
Q. Xu
T. J. Yamaguchi
K. Yamazaki
A. Yessayan
H. Yokoyama
T. Yoneda
M. Yoshida
M. Yoshimura

More Information

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For general information:

General Chair - ats08-gc@dsgn.im.hiroshima-cu.ac.jp

For regular session information:

Program Chair - ats08-pc@dsgn.im.hiroshima-cu.ac.jp

For industry session information:

Industrial Arrangement Chair - ats08-ic@dsgn.im.hiroshima-cu.ac.jp

For more information, visit us on the web at: http://ats08.info.hiroshima-cu.ac.jp

The Seventeenth Asian Test Symposium (ATS'08) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC), the IEICE Information and Systems Society Technical Committee on DC, and the IEICE Kyushu Institute of Technology (approval pending) .

TTTC's Electronic Broadcasting Service
	The Seventeenth Asian Test Symposium (ATS'08) November 24-27, 2008 Keio Plaza Hotel Sapporo Sapporo, JAPAN http://ats08.info.hiroshima-cu.ac.jp